株式会社ルネサス東日本セミコンダクタ
Device & Assembly

Wafer Probe

HOME>Device & Assembly>Wafer Probe

We provide you with best test solutions by making full use of technological prowess and know-how specific to manufactures specializing in semiconductors and the latest-type testers and wafer probers.

Wafer Probe

We operate wafer level electrical test of LSI, and provide the test results information.

About Our Business Activities

  • Volume-production Test System
    • Reliable Quality Control
    • For Lower Costs
    • Responding to Shorter Delivery Times
    • Responding to Small Batches of a variety of Products
  • Test Engineering Support
    • Test Program Development/Debugging
    • Probe Card Design/making
    • Test Board Design/making
  • Information Provision Service
    • Test Result Summary Information
    • Production Control Result Information

We provide testing service for Logic LSI, LCD Driver and Memory.

tester process
tester process
 

Test Environment

  • Cleanliness: Class 1,000
  • ESD Sensitivity

Tester Lineup

 
wafer process

In a wafer state, electrical characteristics tests are conducted on LSIs.

Page Top

Search by Google